Scanning Electronic Microscope FESEM Auriga (Crossbeam 540)

About the equipment

The ZEISS Crossbeam 540 is FIB-SEMs indicated for nanotomography and nanofabrication. Using Crossbeam, imaging and analytical performance of the GEMINI column can be linked for sample preparation and material processing under a nanoscopic scale. Your low kV SEM performance can be combined with FIB currents up to 100 nA to speed up the nanotomography and nanofabrication. It has an easy-to-understand graphical user interface and users can benefit from a maximum stability and a standard beam profile, making the device more reliable during complicated and long experiments.


Additional information

Location:

Laboratory 9141A Block 9 main building Nazarbayev University Astana, Kabanbay batyr ave. 53

Fees Usage Fee: Free of charge

 

For general inquiries, contact:

Manager of OSRF Tel: 57-16 E-mail: aliya.kudarova@nu.edu.kz;

For technical inquiries, contact: Scientific director, Ivan Vorobyev.

Tel: 65-41 E-mail: ivan.vorobyev@nu.edu.kz.